This course provides an in-depth study of the important instruments that have been developed to analyze nanostructured materials. Useful information that is derived from scattering processes involving X-rays, visible light, electrons, and neutrons will be studied. Microscopic techniques such as Atomic Force Microscopy will also be studied because of the nanoscale structural information that they can provide. The study of spectroscopic techniques also forms part of the course. The application of these instruments to lithographic production techniques is also developed.
